Yasuo Izumi, Fumitaka Kiyotaki, Hideaki Yoshitake, Ken-ichi Aika, Tae Sugihara, Takashi Tatsumi, Yasuhiro Tanizawa, Takafumi Shido, and Yasuhiro Iwasawa
Chemistry Letters, 1154 - 1155 (2002).

Selective XAFS measurements of 0.6 - 3.0 wt% V sites on/in TiO2 were enabled utilizing a fluorescence spectrometer. The V sites were V(IV) species in the case of high-surface-area V-TiO2 in contrast to V(V) species in the case of conventional V/TiO2 catalysts, V supported on HSA-TiO2, and V-TiO2 prepared in the absence of dodecylamine (general sol-gel method).